IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

ISSNs: 0278-0070

Institute of Electrical and Electronics Engineers Inc.

Scopus rating (2021): CiteScore 5.8 SJR 1.039 SNIP 1.469

Journal

Publications

  1. 2021
  2. 2020
  3. EM-Fuzz: Augmented Firmware Fuzzing via Memory Checking

    Gao, J., Xu, Y., Jiang, Y., Liu, Z., Chang, W., Jiao, X. & Sun, J., 7 Jul 2020, (Accepted/In press)

    Article in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

  4. 2017

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