Research output per year
Research output per year
- 27 results
Search results
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2009
Recent developments in the understanding and application of backscattered and secondary electrons in the SEM: Proc. SPIE 7378, 73780Z (2009)
Walker, C. G., Gomati, M. M. E. & Matthew, J. A., 1 May 2009.Research output: Contribution to conference › Other › peer-review
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The role of oxygen in secondary electron contrast of doped semiconductors in LVSEM
Gomati, M. M. E., Zaggout, F. N., Walker, C. G. H. & Zha, X., 1 May 2009.Research output: Contribution to conference › Other
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2002
A small size field emission column for surface studies
El-Gomati, M., Romanovsky, V., Mullerova, I. & Frank, L., 1 Sept 2002, p. 323-333.Research output: Contribution to conference › Other
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Low and very low voltage electron microscopy in semiconductor analysis
El-Gomati, M. M., 1 Jul 2002.Research output: Contribution to conference › Other
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SEM acquired electronic contrast of doped areas in semiconductors and its interpretation
Frank, L., Müllerová, I., Gomati, M. M. E. & Jayakody, H., 2002, p. 144-147.Research output: Contribution to conference › Other
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SEM visualisation of doping in semiconductors
Frank, L., Mullerova, I. & El-Gomati, M., 1 Sept 2002.Research output: Contribution to conference › Other
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2001
A multi-channel detector for Auger spectroscopic analysis
Gelsthorpe, A. & El-Gomati, M., 1 Sept 2001, p. 69-72.Research output: Contribution to conference › Other
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A small size retarding field analyzer
Johnson, S., Mehadevan, J., Enloe, L. & El-Gomati, M., 1 Aug 2001, p. 11-12.Research output: Contribution to conference › Other
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A very low energy electron column fr surface studies
El-Gomati, M., Romanovsky, V., Frank, L. & Mullerova, I., 1 Sept 2001, p. 111-114.Research output: Contribution to conference › Other
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Contrast reversal of doped semiconductor imaged in LVSEM
El-Gomati, M. & Wells, T., 1 Sept 2001, p. 489-492.Research output: Contribution to conference › Other
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Identification of artefacts due to surface topography in Auger analysis
Gelsthorpe, A. & El-Gomati, M., 1 Aug 2001, p. 241-242.Research output: Contribution to conference › Other
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Imaging doped regions in a semiconductor with very low energy SEM and Auger electrons
El-Gomati, M., Wells, T. & Jayakody, H., 1 Sept 2001, p. 489-492.Research output: Contribution to conference › Other
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Low energy scanning analytical microscope (LeSAM)
El-Gomati, M., 1 Nov 2001.Research output: Contribution to conference › Other
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Very low energy electron microscopy of doped semiconductors
El-Gomati, M. M., Wells, T. & Jayakody, H., 1 Mar 2001, p. 435-438.Research output: Contribution to conference › Other
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2000
A low energy electron column for surface analysis
El-Gomati, M., 1 Jul 2000.Research output: Contribution to conference › Other
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Auger analysis of microfabricated field emission structures
El-Gomati, M., 1 Sept 2000.Research output: Contribution to conference › Other
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Auger analysis of sharp topographies: quantification at high spatial resolution
El-Gomati, M. M., Gelsthorpe, A. & Dell, J. A., 1 Jul 2000, p. 355-358.Research output: Contribution to conference › Other
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Imaging doped semiconductor using SLEEM
El-Gomati, M. M. & Wells, T., 1 Jul 2000.Research output: Contribution to conference › Other
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Low energy SEM of doped semiconductor
El-Gomati, M. M., Wells, T. & Jayakodi, H., 1 Sept 2000.Research output: Contribution to conference › Other
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On the image contrast of doped semiconductors
El-Gomati, M., 1 Jul 2000.Research output: Contribution to conference › Other
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On the imaging of semiconductor doping using low energy electron microscopy
El-Gomati, M. M., Wells, T., Frank, L. & Mullerova, I., 1 Jul 2000, p. 635-636.Research output: Contribution to conference › Other
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Rapid identification of edge artefacts in Scanning Auger Microscopy
Gelsthorpe, A., Jackson, A. & El-Gomati, M. M., 1 Jul 2000.Research output: Contribution to conference › Other
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1999
A fast parallel acquisition electron energy analyser
Walker, C., Walker, A., Badheka, R., Kumashiro, S., Jacka, M., El-Gomati, M. M., Prutton, M. & Read, F., 1999, p. 344-360.Research output: Contribution to conference › Other
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Auger analysis of microfabricated emitters: A Monte Carlo simulation study
El-Gomati, M. M., Dell, J. A., Yan, H. & Assad, A., 1999, p. 130-131.Research output: Contribution to conference › Other
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Stabilised emission from micro field emitter for electron microscopy
El-Gomati, M. M. & Chen, L., 1999, p. 412-413.Research output: Contribution to conference › Other
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Surface cleanliness and electron backscattering
Stekley, R., Zadrazil, M., El-Gomati, M. M., Frank, L. & Mullerova, I., 1 Apr 1999, p. 344.Research output: Contribution to conference › Other
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To the information depth of the backscattered electron signal
Frank, L., Stekly, R., Zadrazil, M., El-Gomati, M. M. & Mullerova, I., 1 Sept 1999, p. 315-316.Research output: Contribution to conference › Other