Steve Tear

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2016

Simulation of a Bessel box electron energy analyser for analysis of secondary electrons
Suri, A., Pratt, A., El Gomati, M. M., Tear, S. P. & Walker, C. G. H., 29 Aug 2016, The 16th European Microscopy Congress 2016. p. 459-460 2 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2010

Monte Carlo modelling of the low-loss electron signal in scanning electron microscopy and comparison with the BSE signal
Bonet, C., El-Gomati, M. M., Matthew, J. A. D. & Tear, S. P., 2010, 16TH INTERNATIONAL CONFERENCE ON MICROSCOPY OF SEMICONDUCTING MATERIALS. Walther, T., Nellist, P., Hutchison, J. & Cullis, A. (eds.). BRISTOL: IOP Publishing, p. - 4 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
2009

Structural and Electronic Properties of Rare-Earth Nanowires
Pratt, A., Woffinden, C., Bonet, C. & Tear, S. P., 2009, FRACTAL GEOMETRY AND STOCHASTICS IV. Bandt, C., Morters, P. & Zahle, M. (eds.). CAMBRIDGE: Birkhauser Boston, Vol. 1144. p. 51-55 5 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution
1995

Correlating STM with other techniques of surface crystallography.
Tear, S. P., Jones, A. H. & Walton, J. M., 1995, ELECTRON MICROSCOPY AND ANALYSIS 1995. Cherns, D. (ed.). BRISTOL: IOP Publishing, p. 237-242 6 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Research output