Steve Tear

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1994

A NEW APPROACH TO OBTAINING KIKUCHI ELECTRON-DIFFRACTION PATTERNS FOR HOLOGRAPHIC IMAGING
Zhao, H., Tear, S. P., Jones, A. H. & Hobday, D. M., 10 Aug 1994, In: Surface Science. 315, 1-2, p. L1007-L1010 4 p.
Research output: Contribution to journal › Letter › peer-review
1991

OBSERVATION OF A LINE GROWTH FAULT ON THE SI(111)-7X7 SURFACE USING STM
Hadley, M. J. & Tear, S. P., May 1991, In: Surface Science. 247, 1, p. L221-L223 3 p.
Research output: Contribution to journal › Letter › peer-review
1986

AN EVALUATION OF QUASIDYNAMICAL LEED ON 2 ATOMS PER UNIT-CELL SYSTEMS
Tear, S. P., Yousif, S. Y. & Matthew, J. A. D., Sept 1986, In: Surface Science. 175, 2, p. L715-L720 6 p.
Research output: Contribution to journal › Letter › peer-review
LEED SURFACE CRYSTALLOGRAPHY, R-FACTORS AND THE STRUCTURE OF THE (110) SURFACES OF III-V-SEMICONDUCTORS
Cowell, P. G., Prutton, M. & Tear, S. P., Nov 1986, In: Surface Science. 177, 1, p. L915-L924 10 p.
Research output: Contribution to journal › Letter › peer-review

Research output