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Electromagnetic Monitoring of Semiconductor Ageing

Project: Other projectMiscellaneous project

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Description

The ability to monitor the through life ageing of semiconductor devices is useful to provide system health level information. Here we aim to determine the feasibility of methods of monitoring age related performance effects which require no connection to the circuit and no additional circuitry in the design. This may be achieved by monitoring the electromagnetic emissions of the circuit, or its non-linear interaction with an applied electromagnetic field.
AcronymEMS
StatusFinished
Effective start/end date1/10/141/10/20

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