Electromagnetic Monitoring of Semiconductor Ageing

Dawson, John Frederick (Principal investigator)
Flintoft, Ian David (Co-investigator)
Dimech, Evan (Student)

Electronic Engineering

Project: Other project › Miscellaneous project

3 Conference contribution

3 results

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2024

IGBT'S AGEING AND ITS IMPACTS ON THE EM CONDUCTED EMISSIONS
Dimech, E. & Dawson, J. F., 2 Sept 2024, EMC Europe 2024. (EMC Europe).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Open Access
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2019

Switching Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress
Dimech, E. & Dawson, J. F., 14 Oct 2019, IECON 2019 - 45th Annual Conference of the IEEE Industrial Electronics Society. Lisbon, Portugal, p. 4648-4653 6 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Open Access
File
2018

Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress
Dimech, E. & Dawson, J. F., 21 Oct 2018, IECON 2018 - 44th Annual Conference of the IEEE Industrial Electronics Society. p. 5924-5929 6 p.
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Open Access
File