EM Monitoring of Through life semiconductor ageing

Project: Research project (funded)Research

Project Details


As the semiconductors age toward eventual failure, their non-linear behaviour changes and this may be detected by changes in their electromagnetic emissions.

Layman's description

The work was a feasibility study into the possibility detection of incipient failure of electronic systems without need to connect to the system.

Key findings

The change in emissions of a microcontroller were detected as it was artificially aged.
Effective start/end date1/09/1331/05/14


  • EPSRC: £17,250.00