A Fast and Accurate Intermediate Level Modelling Approach for Electromagnetic Compatibility Analysis of Enclosures

I D Flintoft, N L Whyman, J F Dawson, T Konefal

Research output: Contribution to journalArticlepeer-review

Original languageUndefined/Unknown
Pages (from-to)281-285
Number of pages5
JournalIEE Proceedings on Science, Measurement and Technology
Issue number5
Publication statusPublished - 1 Sept 2002

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