A geometry for sub-nanosecond X-ray diffraction from laser-shocked polycrystalline foils

Justin Wark*, Andrew Higginbotham, Giles Kimminau, William Murphy, Bob Nagler, Thomas Whitcher, James Hawreliak, Dan Kalantar, Martin Butterfield, Bassem El-Dasher, James McNaney, Despina Milathianaki, Hector Lorenzana, Bruce Remington, Huw Davies, Lee Thornton, Nigel Park, Stan Lukezic

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In situ picosecond X-ray diffraction has proved to be a useful tool in furthering our understanding of the response of shocked crystals at the lattice level. To date the vast majority of this work has used single crystals as the shocked samples, owing to their diffraction efficiency, although the study of the response of polycrystalline samples is clearly of interest for many applications. We present here the results of experiments to develop sub-nanosecond powder/polycrystalline diffraction using a cylindrical pinhole camera. By allowing the incident X-ray beam to impinge on the sample at non-normal angles, the response of grains making a variety of angles to the shock propagation direction can potentially be interrogated.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages1345-1348
Number of pages4
Volume955
DOIs
Publication statusPublished - 1 Dec 2007
Event15th Biennial International Conference of the APS Topical Group on Shock Compression of Condensed Matter, SCCM 2007 - Waikoloa, HI, United Kingdom
Duration: 24 Jun 200729 Jun 2007

Conference

Conference15th Biennial International Conference of the APS Topical Group on Shock Compression of Condensed Matter, SCCM 2007
Country/TerritoryUnited Kingdom
CityWaikoloa, HI
Period24/06/0729/06/07

Keywords

  • Diffraction
  • X-ray

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