Abstract
In situ picosecond X-ray diffraction has proved to be a useful tool in furthering our understanding of the response of shocked crystals at the lattice level. To date the vast majority of this work has used single crystals as the shocked samples, owing to their diffraction efficiency, although the study of the response of polycrystalline samples is clearly of interest for many applications. We present here the results of experiments to develop sub-nanosecond powder/polycrystalline diffraction using a cylindrical pinhole camera. By allowing the incident X-ray beam to impinge on the sample at non-normal angles, the response of grains making a variety of angles to the shock propagation direction can potentially be interrogated.
Original language | English |
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Title of host publication | AIP Conference Proceedings |
Pages | 1345-1348 |
Number of pages | 4 |
Volume | 955 |
DOIs | |
Publication status | Published - 1 Dec 2007 |
Event | 15th Biennial International Conference of the APS Topical Group on Shock Compression of Condensed Matter, SCCM 2007 - Waikoloa, HI, United Kingdom Duration: 24 Jun 2007 → 29 Jun 2007 |
Conference
Conference | 15th Biennial International Conference of the APS Topical Group on Shock Compression of Condensed Matter, SCCM 2007 |
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Country/Territory | United Kingdom |
City | Waikoloa, HI |
Period | 24/06/07 → 29/06/07 |
Keywords
- Diffraction
- X-ray