A statistical approach to radiated immunity testing of digital hardware based in a reverberation chamber

J Chen, A C Marvin, Ian David Flintoft, J F Dawson

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Conference participation

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EMC Europe 2010
Flintoft, I. D. (Speaker)
13 Sept 2010 → 17 Sept 2010
Activity: Participating in or organising an event › Conference participation