Original language | English |
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Title of host publication | EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany |
Subtitle of host publication | Vol 1: Instrumentation and Methods |
Editors | M Luysberg, K Tillmann, T Weirich |
Publisher | Springer |
Pages | 481 |
Volume | 1 |
ISBN (Print) | 978-3-540-85154-7 |
Publication status | Published - 2008 |
A very high temperature (2000 °C) stage for atomic resolution in-situ ETEM
Research output: Chapter in Book/Report/Conference proceeding › Chapter