A very high temperature (2000 °C) stage for atomic resolution in-situ ETEM

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
Subtitle of host publication	Vol 1: Instrumentation and Methods
Editors	M Luysberg, K Tillmann, T Weirich
Publisher	Springer
Pages	481
Volume	1
ISBN (Print)	978-3-540-85154-7
Publication status	Published - 2008

Cite this

@inbook{9868906487a647a0a6650c73472bd00d,

title = "A very high temperature (2000 °C) stage for atomic resolution in-situ ETEM",

author = "Gai, {Pratibha L} and Ed Boyes",

year = "2008",

language = "English",

isbn = "978-3-540-85154-7",

volume = "1",

pages = "481",

editor = "M Luysberg and K Tillmann and T Weirich",

booktitle = "EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany",

publisher = "Springer",

address = "Germany",

}