A very high temperature (2000 °C) stage for atomic resolution in-situ ETEM

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Title of host publicationEMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
DatePublished - 2008
Pages481
PublisherSpringer
EditorsM Luysberg, K Tillmann, T Weirich
Volume1
Original languageEnglish
ISBN (Print)978-3-540-85154-7

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