Aberration corrected environmental STEM (AC ESTEM) for dynamic in-situ gas reaction studies of nanoparticle catalysts

Ed Boyes; Pratibha L Gai

Aberration corrected environmental STEM (AC ESTEM) for dynamic in-situ gas reaction studies of nanoparticle catalysts

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.

Original language	English
Title of host publication	J Phys Conf Ser
Publisher	IOP Publishing
Publication status	Accepted/In press - 2013

Keywords

ESTEM, Catalysis, In-situ

Cite this

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title = "Aberration corrected environmental STEM (AC ESTEM) for dynamic in-situ gas reaction studies of nanoparticle catalysts",

abstract = "Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.",

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author = "Ed Boyes and Gai, {Pratibha L}",

year = "2013",

language = "English",

booktitle = "J Phys Conf Ser",

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AU - Boyes, Ed

AU - Gai, Pratibha L

PY - 2013

Y1 - 2013

N2 - Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.

AB - Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.

KW - ESTEM, Catalysis, In-situ

M3 - Conference contribution

BT - J Phys Conf Ser

PB - IOP Publishing

ER -