Aberration corrected environmental STEM (AC ESTEM) for dynamic in-situ gas reaction studies of nanoparticle catalysts

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Environmental scanning transmission electron microscopy (ESTEM) with aberration correction (AC) has recently been added to the capabilities of the more established ETEM for analysis of heterogeneous nanoparticle based catalysts. It has helped to reveal the importance and potentially unique properties of individual atoms as active sites in their own right as well as pathways between established nanoparticles. A new capability is introduced for dynamic in-situ experiments under controlled conditions of specimen temperature and gas environment related to real world conditions pertinent to a range of industrial and societal priorities for new and improved chemical processes, materials, fuels, pharmaceutical products and processes, and in control or remediation of environmental emissions.
Original languageEnglish
Title of host publicationJournal of Physics: Conference Series
Subtitle of host publicationElectron Microscopy and Analysis Group Conference 2013 (EMAG 2013)
Place of PublicationBristol
PublisherIOP Publishing
Number of pages6
Publication statusPublished - 2014

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