Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS

Matthieu Bugnet; Khalil El Hajraoui; Adam Kerrigan; Vlado K. Lazarov; Guillaume Radtke; Quentin M. Ramasse; Demie Kepatsoglou

doi:10.1093/mam/ozae044.753

Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS

Matthieu Bugnet^*, Khalil El Hajraoui, Adam Kerrigan, Vlado K. Lazarov, Guillaume Radtke, Quentin M. Ramasse, Demie Kepatsoglou

^*Corresponding author for this work

Physics

Research output: Contribution to journal › Meeting abstract › peer-review

Original language	English
Pages (from-to)	1524-1525
Number of pages	2
Journal	Microscopy and Microanalysis
Volume	30
Issue number	2024
DOIs	https://doi.org/10.1093/mam/ozae044.753
Publication status	Published - 24 Jul 2024
Event	82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 - Cleveland, United States Duration: 28 Jul 2024 → 1 Aug 2024

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10.1093/mam/ozae044.753

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@article{686167b143e943c98d5362b87b0d62dc,

title = "Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS",

author = "Matthieu Bugnet and {El Hajraoui}, Khalil and Adam Kerrigan and Lazarov, {Vlado K.} and Guillaume Radtke and Ramasse, {Quentin M.} and Demie Kepatsoglou",

year = "2024",

month = jul,

day = "24",

doi = "10.1093/mam/ozae044.753",

language = "English",

volume = "30",

pages = "1524--1525",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Cambridge University Press",

number = "2024",

note = "82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024 ; Conference date: 28-07-2024 Through 01-08-2024",

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TY - JOUR

T1 - Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS

AU - Bugnet, Matthieu

AU - El Hajraoui, Khalil

AU - Kerrigan, Adam

AU - Lazarov, Vlado K.

AU - Radtke, Guillaume

AU - Ramasse, Quentin M.

AU - Kepatsoglou, Demie

PY - 2024/7/24

Y1 - 2024/7/24

UR - http://www.scopus.com/inward/record.url?scp=85215689394&partnerID=8YFLogxK

U2 - 10.1093/mam/ozae044.753

DO - 10.1093/mam/ozae044.753

M3 - Meeting abstract

AN - SCOPUS:85215689394

SN - 1431-9276

VL - 30

SP - 1524

EP - 1525

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

IS - 2024

T2 - 82nd Annual Meeting Microscopy Society of America and the 58th Annual Meeting Microanalysis Society, M and M 2024

Y2 - 28 July 2024 through 1 August 2024

ER -

Accessing d-d Excitations Around Misfit Dislocations in Strongly Correlated NiO Thin Films Using High Energy-Resolution EELS

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