Analysis and Compensation of Sampling Errors in TPFS IPMSM Drives With Single Current Sensor

jiadong lu; Yihua Hu; Jinglin Liu

doi:10.1109/TIE.2018.2838114

Analysis and Compensation of Sampling Errors in TPFS IPMSM Drives With Single Current Sensor

jiadong lu, Yihua Hu, Jinglin Liu

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	3852-3855
Number of pages	4
Journal	IEEE Transactions on Industrial Electronics
Volume	66
Issue number	5
Early online date	24 May 2018
DOIs	https://doi.org/10.1109/TIE.2018.2838114
Publication status	Published - May 2019

Bibliographical note

© IEEE, 2018. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details.

Access to Document

10.1109/TIE.2018.2838114

ALL_17-TIE-3309
© IEEE, 2018. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details.
Accepted author manuscript, 992 KB

https://livrepository.liverpool.ac.uk/3025886/

Cite this

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title = "Analysis and Compensation of Sampling Errors in TPFS IPMSM Drives With Single Current Sensor",

author = "jiadong lu and Yihua Hu and Jinglin Liu",

note = "{\textcopyright} IEEE, 2018. This is an author-produced version of the published paper. Uploaded in accordance with the publisher{\textquoteright}s self-archiving policy. Further copying may not be permitted; contact the publisher for details.",

year = "2019",

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AU - Hu, Yihua

AU - Liu, Jinglin

N1 - © IEEE, 2018. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details.

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Y1 - 2019/5

U2 - 10.1109/TIE.2018.2838114

DO - 10.1109/TIE.2018.2838114

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EP - 3855

JO - IEEE Transactions on Industrial Electronics

JF - IEEE Transactions on Industrial Electronics

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