Angstrom analysis with dynamic in-situ aberration corrected electron microscopy

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Following the pioneering development of atomic resolution in-situ environmental TEM (ETEM) for direct probing of gas-solid reactions, recent developments are presented of dynamic real time in-situ studies at the Angstrom level in an aberration corrected electron microscope. The in-situ data from Pt-Pd nanoparticles on carbon with the corresponding FFT/optical diffractogram (OD) illustrate an achieved resolution of <0.11 nm at 500 °C and higher, in a double aberration corrected JEOL 2200 FS TEM/STEM employing a wider gap objective pole piece and gas tolerant TMP column pumping system. Direct observations of dynamic biofuel catalysts under controlled calcinations conditions and quantified with catalytic reactivity and physico-chemical studies show the benefits in-situ aberration correction in unveiling the evolution of surface active sites necessary for the development efficient heterogeneous catalysts. The new results open up opportunities for dynamic studies of materials in an aberration corrected environment and direct future development activities.
Original languageEnglish
Title of host publicationElectron Microscopy and Analysis Group Conference 2009 (EMAG 2009)
PublisherTaylor & Francis
Number of pages6
Publication statusPublished - 1 Jan 2010

Publication series

NameInstitute of Physics Conference Series
PublisherIOP Publishing LTD
ISSN (Print)1742-6588



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