Angular distribution of field emitted electrons from vertically aligned carbon nanotube arrays

Mohamed M El Gomati; S. Iacobucci; M. Fratini; A. Rizzo; F. Scarinci; Y. Zhang; M. Mann; C. Li; W. I. Milne; S. Lagomarsino; G. Stefani

doi:10.1063/1.3681398

Angular distribution of field emitted electrons from vertically aligned carbon nanotube arrays

Mohamed M El Gomati, S. Iacobucci, M. Fratini, A. Rizzo, F. Scarinci, Y. Zhang, M. Mann, C. Li, W. I. Milne, S. Lagomarsino, G. Stefani

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

Angular field emission (FE) properties of vertically aligned carbon nanotube arrays have been measured on samples grown by plasma enhanced chemical vapor deposition and characterized by scanning electron microscope and I-V measurements. These properties determine the angular divergence of electron beams, a crucial parameter in order to obtain high brilliance FE based cathodes. From angular distributions of the electron beam transmitted through extraction grids of different mesh size and by using ray-tracing simulations, the maximum emission angle from carbon nanotube tips has been determined to be about ± 30° around the tube main axis.

Original language	English
Pages (from-to)	053116
Journal	Applied Physics Letters
Volume	100
Early online date	2 Feb 2012
DOIs	https://doi.org/10.1063/1.3681398
Publication status	Published - 2 Feb 2012

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10.1063/1.3681398

Cite this

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title = "Angular distribution of field emitted electrons from vertically aligned carbon nanotube arrays",

abstract = "Angular field emission (FE) properties of vertically aligned carbon nanotube arrays have been measured on samples grown by plasma enhanced chemical vapor deposition and characterized by scanning electron microscope and I-V measurements. These properties determine the angular divergence of electron beams, a crucial parameter in order to obtain high brilliance FE based cathodes. From angular distributions of the electron beam transmitted through extraction grids of different mesh size and by using ray-tracing simulations, the maximum emission angle from carbon nanotube tips has been determined to be about ± 30° around the tube main axis.",

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doi = "10.1063/1.3681398",

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AU - El Gomati, Mohamed M

AU - Iacobucci, S.

AU - Fratini, M.

AU - Rizzo, A.

AU - Scarinci, F.

AU - Zhang, Y.

AU - Mann, M.

AU - Li, C.

AU - Milne, W. I.

AU - Lagomarsino, S.

AU - Stefani, G.

PY - 2012/2/2

Y1 - 2012/2/2

N2 - Angular field emission (FE) properties of vertically aligned carbon nanotube arrays have been measured on samples grown by plasma enhanced chemical vapor deposition and characterized by scanning electron microscope and I-V measurements. These properties determine the angular divergence of electron beams, a crucial parameter in order to obtain high brilliance FE based cathodes. From angular distributions of the electron beam transmitted through extraction grids of different mesh size and by using ray-tracing simulations, the maximum emission angle from carbon nanotube tips has been determined to be about ± 30° around the tube main axis.

AB - Angular field emission (FE) properties of vertically aligned carbon nanotube arrays have been measured on samples grown by plasma enhanced chemical vapor deposition and characterized by scanning electron microscope and I-V measurements. These properties determine the angular divergence of electron beams, a crucial parameter in order to obtain high brilliance FE based cathodes. From angular distributions of the electron beam transmitted through extraction grids of different mesh size and by using ray-tracing simulations, the maximum emission angle from carbon nanotube tips has been determined to be about ± 30° around the tube main axis.

U2 - 10.1063/1.3681398

DO - 10.1063/1.3681398

M3 - Article

SN - 0003-6951

VL - 100

SP - 053116

JO - Applied Physics Letters

JF - Applied Physics Letters

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