Abstract
Angular field emission (FE) properties of vertically aligned carbon nanotube arrays have been measured on samples grown by plasma enhanced chemical vapor deposition and characterized by scanning electron microscope and I-V measurements. These properties determine the angular divergence of electron beams, a crucial parameter in order to obtain high brilliance FE based cathodes. From angular distributions of the electron beam transmitted through extraction grids of different mesh size and by using ray-tracing simulations, the maximum emission angle from carbon nanotube tips has been determined to be about ± 30° around the tube main axis.
Original language | English |
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Pages (from-to) | 053116 |
Journal | Applied Physics Letters |
Volume | 100 |
Early online date | 2 Feb 2012 |
DOIs | |
Publication status | Published - 2 Feb 2012 |