Anisotropy constant of antiferromagnetic Pt50Mn50

William James Frost; Robert Carpenter; Gonzalo Vallejo Fernandez

doi:10.1088/1361-6463/ad2564

Anisotropy constant of antiferromagnetic Pt50Mn50

William James Frost, Robert Carpenter, Gonzalo Vallejo Fernandez

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.

Original language	English
Article number	185003
Number of pages	10
Journal	Journal of Physics D: Applied Physics
Volume	57
DOIs	https://doi.org/10.1088/1361-6463/ad2564
Publication status	Published - 13 Feb 2024

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10.1088/1361-6463/ad2564Licence: CC BY

Anisotropy constant of antiferromagnetic Pt50Mn50
© 2024 The Author(s)
Final published version, 6.14 MBLicence: CC BY

Cite this

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abstract = "We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials. ",

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AU - Frost, William James

AU - Carpenter, Robert

AU - Vallejo Fernandez, Gonzalo

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N2 - We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.

AB - We have measured the anisotropy constant of polycrystalline PtMn thin films deposited on different seed layer materials: Pt, Ru and Nb. Values as high as 2.5x10^7 erg/cc were achieved for samples deposited on Pt. The films can be crystallised into the antiferromagnetic, face-centred-tetragonal phase on Ru and Pt seed layers at annealing temperatures compatible with back-end-of-line conditions of up to 400C for one to three hours. Additionally these antiferromagnetic layers, 8 nm thick, are highly thermally stable with median blocking temperatures above 200C. The effect of diffusion on the stoichiometry of the PtMn layers is discussed with regards to the different seed layer materials.

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JO - Journal of Physics D: Applied Physics

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