Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	48-49
Journal	Microscopy and Microanalysis
Volume	12
Issue number	S02
DOIs	https://doi.org/10.1017/S1431927606069546
Publication status	Published - 2006

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title = "Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities",

author = "Gai, {Pratibha L}",

year = "2006",

doi = "10.1017/S1431927606069546",

language = "English",

volume = "12",

pages = "48--49",

journal = "Microscopy and Microanalysis",

issn = "1431-9276",

publisher = "Oxford University Press",

number = "S02",

}

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T1 - Atomic Resolution In-situ Environmental (Scanning) TEM (ES/TEM) for Probing Gas-Solid Reactions: Applications and Opportunities

AU - Gai, Pratibha L

PY - 2006

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VL - 12

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EP - 49

JO - Microscopy and Microanalysis

JF - Microscopy and Microanalysis

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