Automatic Test Data Generation for Multiple Condition and MCDC Coverage

Kamran Ghani, John A. Clark, Kenneth Boness, João M. Fernandes, Jon G. Hall, Ricardo Jorge Machado, Roy Oberhauser

Research output: Contribution to conference › Paper › peer-review

Access to Document

TY - CONF

T1 - Automatic Test Data Generation for Multiple Condition and MCDC Coverage

AU - Ghani, Kamran

AU - Clark, John A.

AU - Boness, Kenneth

AU - Fernandes, João M.

AU - Hall, Jon G.

AU - Machado, Ricardo Jorge

AU - Oberhauser, Roy

PY - 2009

Y1 - 2009

UR - http://www.scopus.com/inward/record.url?scp=70749101712&partnerID=8YFLogxK

M3 - Paper

SP - 152

EP - 157

ER -