Characterization of Photovoltaic Cells Using Time Domain Voltage Decay Analysis

Olufemi Olayiwola, Paul Barendse

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper is focused on the dynamic characterization of the silicon wafer-based photovoltaic cells. The open circuit voltage decay of the solar cell under dark and illumination conditions are observed and analysed to model the dynamic parameters at different voltage bias. The procedure is developed for near real-time analysis and thus used to investigate parameter variation of the cell under partial-shading condition. The results obtained are compared and further validated against values from frequency domain analysis using Impedance spectroscopy (IS). Analysis of results show that with a test duration of 1sec, an estimate of the carrier life time and R-C parameters can be made. This assessment can be used as a basis to estimate the charge extraction and recombination efficiency of different cells/modules in real-time applications, as well as, cell/string level fault detection in grid-applications.

Original languageEnglish
Title of host publicationIEEE AFRICON 2019
Subtitle of host publicationPowering Africa's Sustainable Energy for All Agenda: The Role of ICT and Engineering, AFRICON 2019
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9781728132891
DOIs
Publication statusPublished - Sept 2019
Event2019 IEEE AFRICON, AFRICON 2019 - Accra, Ghana
Duration: 25 Sept 201927 Sept 2019

Publication series

NameIEEE AFRICON Conference
Volume2019-September
ISSN (Print)2153-0025
ISSN (Electronic)2153-0033

Conference

Conference2019 IEEE AFRICON, AFRICON 2019
Country/TerritoryGhana
CityAccra
Period25/09/1927/09/19

Bibliographical note

Publisher Copyright:
© 2019 IEEE.

Keywords

  • Characterization
  • parameters
  • photovoltaic cell
  • silicon
  • time-domain
  • voltage decay

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