Closed-Loop Characterization of Noise and Stability in a Mode-Localized Resonant MEMS Sensor

Milind Pandit*, Chun Zhao, Guillermo Sobreviela, Arif Mustafazade, Sijun Du, Xudong Zou, Ashwin A. Seshia

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Abstract

This paper presents results from the closed-loop characterization of an electrically coupled mode-localized sensor topology including measurements of amplitude ratios over a long duration, stability, noise floor, and the bandwidth of operation. The sensitivity of the prototype sensor is estimated to be-5250 in the linear operation regime. An input-referred stability of 84 ppb with respect to normalized stiffness perturbations is achieved at 500 s. When compared to frequency shift sensing within the same device, amplitude ratio sensing provides higher resolution for long-term measurements due to the intrinsic common-mode rejection properties of a mode-localized system. A theoretical framework is established to quantify noise floor associated with measurements validated through numerical simulations and experimental data. In addition, the operating bandwidth of the sensor is found to be 3.5 Hz for 3-dB flatness.

Original languageEnglish
Article number8510830
Pages (from-to)170-180
Number of pages11
JournalIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control
Volume66
Issue number1
DOIs
Publication statusPublished - Jan 2019

Bibliographical note

Funding Information:
Manuscript received September 29, 2017; accepted October 22, 2018. Date of publication October 26, 2018; date of current version January 14, 2019. This work was supported in part by Innovate, U.K. and in part by Natural Environment Research Council. This paper is an extended version of a conference paper presented at the 2017 European Frequency and Time Forum and International Frequency Control Symposium [1]. (Milind Pandit and Chun Zhao contributed equally to this work.) (Corresponding author: Milind Pandit.) M. Pandit, C. Zhao, G. Sobreviela, A. Mustafazade, S. Du, and A. A. Seshia are with the Nanoscience Centre, University of Cambridge, Cambridge CB3 0FF, U.K. (e-mail: mnp26. . .ac.uk; cz319. . .ac.uk; aas41. . .ac.uk).

Publisher Copyright:
© 1986-2012 IEEE.

Keywords

  • Force sensitivity
  • force sensor
  • MEMS
  • resonant sensor
  • thermal noise

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