Abstract
In a recent paper Sai et al. [1] identified a correction R^{dyn}$ to the DC conductance of nanoscale junctions arising from dynamical exchange-correlation (XC) effects within time-dependent density functional theory. This quantity contributes to the total resistance through $R=R_{s}+R^{dyn}$ where $R_{s}$ is the resistance evaluated in the absence of dynamical $XC$ effects. In this Comment we show that the numerical estimation of $R^{dyn}$ in example systems of the type they considered should be considerably reduced, once a more appropriate form for the shear electron viscosity ¿ is used.
Original language | English |
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Article number | 259701 |
Pages (from-to) | - |
Number of pages | 1 |
Journal | Physical Review Letters |
Volume | 98 |
Issue number | 25 |
DOIs | |
Publication status | Published - 22 Jun 2007 |