Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy

T P A Hase; E M Ho; J J Freijo; S M Thompson; A K Petford-Long; B K Tanner

Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy

T P A Hase, E M Ho, J J Freijo, S M Thompson, A K Petford-Long, B K Tanner

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Grazing incidence x-ray scattering and cross-sectional high-resolution electron microscopy (HREM) have been applied to the study of thin trilayers of the miscible system Co-Cr-Co grown by ultra-high vacuum evaporation on silicon. Good agreement was found between numerical values for layer thickness deduced by the two techniques. The Co-Cr interface roughness was found to be low with substantial interdiffusion, significantly greater than the roughness amplitude. HREM images confirmed the diffuseness of the interfaces. The roughness had a lateral correlation length of typically 150 Angstrom and a very low fractal parameter h of 0.15. The correlation length was always found to Correspond to the lateral grain size observed in the HREM images.

Original language	English
Pages (from-to)	A231-A235
Number of pages	5
Journal	Journal of Physics D: Applied Physics
Volume	36
Issue number	10A
Publication status	Published - 21 May 2003

Keywords

EPITAXIAL CO/CR SUPERLATTICES
MAGNETIC-ANISOTROPY
MULTILAYERS

Cite this

@article{39b359e0186b4530b705f55c2608c72e,

title = "Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy",

abstract = "Grazing incidence x-ray scattering and cross-sectional high-resolution electron microscopy (HREM) have been applied to the study of thin trilayers of the miscible system Co-Cr-Co grown by ultra-high vacuum evaporation on silicon. Good agreement was found between numerical values for layer thickness deduced by the two techniques. The Co-Cr interface roughness was found to be low with substantial interdiffusion, significantly greater than the roughness amplitude. HREM images confirmed the diffuseness of the interfaces. The roughness had a lateral correlation length of typically 150 Angstrom and a very low fractal parameter h of 0.15. The correlation length was always found to Correspond to the lateral grain size observed in the HREM images.",

keywords = "EPITAXIAL CO/CR SUPERLATTICES, MAGNETIC-ANISOTROPY, MULTILAYERS",

author = "Hase, {T P A} and Ho, {E M} and Freijo, {J J} and Thompson, {S M} and Petford-Long, {A K} and Tanner, {B K}",

year = "2003",

month = may,

day = "21",

language = "English",

volume = "36",

pages = "A231--A235",

journal = "Journal of Physics D: Applied Physics",

issn = "1361-6463",

publisher = "IOP Publishing",

number = "10A",

}

TY - JOUR

T1 - Comparison of interface structure of thin miscible films by grazing incidence x-ray scattering and high-resolution electron microscopy

AU - Hase, T P A

AU - Ho, E M

AU - Freijo, J J

AU - Thompson, S M

AU - Petford-Long, A K

AU - Tanner, B K

PY - 2003/5/21

Y1 - 2003/5/21

N2 - Grazing incidence x-ray scattering and cross-sectional high-resolution electron microscopy (HREM) have been applied to the study of thin trilayers of the miscible system Co-Cr-Co grown by ultra-high vacuum evaporation on silicon. Good agreement was found between numerical values for layer thickness deduced by the two techniques. The Co-Cr interface roughness was found to be low with substantial interdiffusion, significantly greater than the roughness amplitude. HREM images confirmed the diffuseness of the interfaces. The roughness had a lateral correlation length of typically 150 Angstrom and a very low fractal parameter h of 0.15. The correlation length was always found to Correspond to the lateral grain size observed in the HREM images.

AB - Grazing incidence x-ray scattering and cross-sectional high-resolution electron microscopy (HREM) have been applied to the study of thin trilayers of the miscible system Co-Cr-Co grown by ultra-high vacuum evaporation on silicon. Good agreement was found between numerical values for layer thickness deduced by the two techniques. The Co-Cr interface roughness was found to be low with substantial interdiffusion, significantly greater than the roughness amplitude. HREM images confirmed the diffuseness of the interfaces. The roughness had a lateral correlation length of typically 150 Angstrom and a very low fractal parameter h of 0.15. The correlation length was always found to Correspond to the lateral grain size observed in the HREM images.

KW - EPITAXIAL CO/CR SUPERLATTICES

KW - MAGNETIC-ANISOTROPY

KW - MULTILAYERS

M3 - Article

SN - 1361-6463

VL - 36

SP - A231-A235

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 10A

ER -