Contactless measurement of giant magnetoresistance in thin films by infrared reflection

J P Camplin, S M Thompson, D R Loraine, D I Pugh, J F Collingwood, E M McCash, A B Horn

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The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].

Original languageEnglish
Pages (from-to)4846-4848
Number of pages3
JournalJournal of Applied Physics
Issue number9
Publication statusPublished - 1 May 2000



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