Contactless measurement of giant magnetoresistance in thin films by infrared reflection

J P Camplin; S M Thompson; D R Loraine; D I Pugh; J F Collingwood; E M McCash; A B Horn

Contactless measurement of giant magnetoresistance in thin films by infrared reflection

J P Camplin, S M Thompson, D R Loraine, D I Pugh, J F Collingwood, E M McCash, A B Horn

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].

Original language	English
Pages (from-to)	4846-4848
Number of pages	3
Journal	Journal of Applied Physics
Volume	87
Issue number	9
Publication status	Published - 1 May 2000

Keywords

GRANULAR FILMS

Cite this

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title = "Contactless measurement of giant magnetoresistance in thin films by infrared reflection",

abstract = "The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].",

keywords = "GRANULAR FILMS",

author = "Camplin, {J P} and Thompson, {S M} and Loraine, {D R} and Pugh, {D I} and Collingwood, {J F} and McCash, {E M} and Horn, {A B}",

year = "2000",

month = may,

day = "1",

language = "English",

volume = "87",

pages = "4846--4848",

journal = "Journal of Applied Physics",

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TY - JOUR

T1 - Contactless measurement of giant magnetoresistance in thin films by infrared reflection

AU - Camplin, J P

AU - Thompson, S M

AU - Loraine, D R

AU - Pugh, D I

AU - Collingwood, J F

AU - McCash, E M

AU - Horn, A B

PY - 2000/5/1

Y1 - 2000/5/1

N2 - The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].

AB - The magnetorefractive effect (MRE) has been demonstrated in reflection for giant magnetoresistive Co30Ag70/Si(100) granular films, 400 and 1000 Angstrom thick. Measurements of infrared radiation in the 2-14 mu m range indicate a sensitivity to polarization of the incident light and an enhanced response at oblique angles of incidence. Direct correlation with dc magnetoresistance measurements has been demonstrated but computer simulations show that current theory is unable to satisfactorily model experimental observation. (C) 2000 American Institute of Physics. [S0021-8979(00)57808-6].

KW - GRANULAR FILMS

M3 - Article

SN - 0021-8979

VL - 87

SP - 4846

EP - 4848

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9

ER -