Abstract
In this paper we describe a method for deposition of ferromagnetic thin films with controlled grain size and distribution. The close control of grain size without the use of seed layers is demonstrated for NiFe – permalloy films by using a novel sputtering technology. We also present a detailed analysis of the grain size distribution based on the cumulative percentage technique. This is a more convenient mathematical approach to the study of particle size distributions as it gives consistent results even for a small number of particles.
| Original language | English |
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| Pages (from-to) | 6-9 |
| Journal | Journal of Condensed Matter Physics |
| Volume | 1 |
| Issue number | 1 |
| Publication status | Published - 2013 |