Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware

I D Flintoft; M P Robinson; K Fischer; A C Marvin

Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware

I D Flintoft, M P Robinson, K Fischer, A C Marvin

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The emission spectrum of digital hardware under the influence of an external threat field contains information about the interaction of the threat energy with the digital signals in the system. We pre-sent measurements showing how the characteristics of the reemission spectrum from a simple circuit may be correlated with variations in the timings of logic transitions within the circuit. This provides a direct link between the re-emission spectrum and dynamic failures in digital hardware and may therefore form the basis of an immunity measurement or diagnostic technique for digital equipment.

Original language	English
Title of host publication	2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2
Place of Publication	NEW YORK
Publisher	IEEE
Pages	541-546
Number of pages	6
ISBN (Print)	0-7803-6569-0
Publication status	Published - 2001
Event	IEEE International Symposium on Electromagnetic Compatibility - MONTREAL Duration: 13 Aug 2001 → 17 Aug 2001

Conference

Conference	IEEE International Symposium on Electromagnetic Compatibility
City	MONTREAL
Period	13/08/01 → 17/08/01

Keywords

PREDICTION
SYSTEMS

Cite this

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title = "Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware",

abstract = "The emission spectrum of digital hardware under the influence of an external threat field contains information about the interaction of the threat energy with the digital signals in the system. We pre-sent measurements showing how the characteristics of the reemission spectrum from a simple circuit may be correlated with variations in the timings of logic transitions within the circuit. This provides a direct link between the re-emission spectrum and dynamic failures in digital hardware and may therefore form the basis of an immunity measurement or diagnostic technique for digital equipment.",

keywords = "PREDICTION, SYSTEMS",

author = "Flintoft, {I D} and Robinson, {M P} and K Fischer and Marvin, {A C}",

year = "2001",

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pages = "541--546",

booktitle = "2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2",

publisher = "IEEE",

address = "United States",

note = "IEEE International Symposium on Electromagnetic Compatibility ; Conference date: 13-08-2001 Through 17-08-2001",

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TY - GEN

T1 - Correlation of timing jitter and the re-emission spectrum in radiated immunity testing of digital hardware

AU - Flintoft, I D

AU - Robinson, M P

AU - Fischer, K

AU - Marvin, A C

PY - 2001

Y1 - 2001

N2 - The emission spectrum of digital hardware under the influence of an external threat field contains information about the interaction of the threat energy with the digital signals in the system. We pre-sent measurements showing how the characteristics of the reemission spectrum from a simple circuit may be correlated with variations in the timings of logic transitions within the circuit. This provides a direct link between the re-emission spectrum and dynamic failures in digital hardware and may therefore form the basis of an immunity measurement or diagnostic technique for digital equipment.

AB - The emission spectrum of digital hardware under the influence of an external threat field contains information about the interaction of the threat energy with the digital signals in the system. We pre-sent measurements showing how the characteristics of the reemission spectrum from a simple circuit may be correlated with variations in the timings of logic transitions within the circuit. This provides a direct link between the re-emission spectrum and dynamic failures in digital hardware and may therefore form the basis of an immunity measurement or diagnostic technique for digital equipment.

KW - PREDICTION

KW - SYSTEMS

M3 - Conference contribution

SN - 0-7803-6569-0

SP - 541

EP - 546

BT - 2001 IEEE EMC INTERNATIONAL SYMPOSIUM, VOLS 1 AND 2

PB - IEEE

CY - NEW YORK

T2 - IEEE International Symposium on Electromagnetic Compatibility

Y2 - 13 August 2001 through 17 August 2001

ER -