Defining a measure for the immunity of analogue to digital converters exposed to electric fields

Tobias Aurand; John F. Dawson; Martin P. Robinson; Andrew C. Marvin

doi:10.1109/ISEMC.2008.4652111

Defining a measure for the immunity of analogue to digital converters exposed to electric fields

Tobias Aurand, John F. Dawson, Martin P. Robinson, Andrew C. Marvin

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both 'ordinary' bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.

Original language	English
Title of host publication	2008 IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY
Place of Publication	NEW YORK
Publisher	IEEE
Pages	588-591
Number of pages	4
ISBN (Electronic)	978-1-4244-1698-1
ISBN (Print)	978-1-4244-1699-8
DOIs	https://doi.org/10.1109/ISEMC.2008.4652111
Publication status	Published - 2008

Keywords

ADC
analogue to digital converter
IEC 62132
Immunity
Statistics

Access to Document

10.1109/ISEMC.2008.4652111

http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=4652111

2 Active

Non-linear Electromagnetic interactions
Dawson, J. F., Robinson, M. P., Flintoft, I. D., Marvin, A., Dawson, L. & Porter, S. J.
1/01/93 → …
Project: Other project › Miscellaneous project
Electromagnetic compatibility of electronic circuits and systems
Dawson, J. F., Robinson, M. P., Porter, S. J., Marvin, A. & Flintoft, I. D.
1/01/90 → …
Project: Other project › Miscellaneous project

Cite this

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abstract = "The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both 'ordinary' bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.",

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AB - The paper describes a method to measure the error in samples of an analogue to digital converter when exposed to RFI. Rather than defining a change from an undisturbed value as an error alone, we will show that both 'ordinary' bit errors as well as the shape of the histogram around the undisturbed value can to be taken into account. How these errors can be measured and why the two types have to be dealt with separately is explained.

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KW - analogue to digital converter

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KW - Immunity

KW - Statistics

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ER -

Defining a measure for the immunity of analogue to digital converters exposed to electric fields

Abstract

Keywords

Access to Document

Projects

Non-linear Electromagnetic interactions

Electromagnetic compatibility of electronic circuits and systems

Cite this