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Direct imaging of ultrafast lattice dynamics

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Author(s)

  • S. Brennan-Brown
  • A. E. Gleason
  • Eric C. Galtier
  • Andrew Higginbotham
  • Brice Arnold
  • A. Fry
  • E. Granados
  • A. Hashim
  • Christian G. Schroer
  • Andreas Schropp
  • Frank Seiboth
  • F. Tavella
  • Z. Xing
  • W. Mao
  • H. J. Lee
  • Bob Nagler

Department/unit(s)

Publication details

JournalScience Advances
DateAccepted/In press - 28 Jan 2019
DatePublished (current) - 8 Mar 2019
Issue number3
Volume5
Number of pages9
Pages (from-to)1-9
Original languageEnglish

Abstract

Under rapid high-temperature, high-pressure loading, lattices exhibit complex elastic-inelastic responses. The dynamics of these responses are challenging to measure experimentally because of high sample density and extremely small relevant spatial and temporal scales. Here, we use an x-ray free-electron laser providing simultaneous in situ direct imaging and x-ray diffraction to spatially resolve lattice dynamics of silicon under high–strain rate conditions.We present the first imaging of a new intermediate elastic feature modulating compression along the axis of applied stress, and we identify the structure, compression, and density behind each observed wave. The ultrafast probe x-rays enabled time-resolved characterization of the intermediate elastic feature, which is leveraged to constrain kinetic inhibition of the phase transformation between 2 and 4 ns. These results not only address long-standing questions about the response of silicon under extreme environments but also demonstrate the potential for ultrafast direct measurements to illuminate new lattice dynamics.

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© 2019 The Authors,

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