Domain wall trapping probed by MR and MFM in submicron ferromagnetic wire structures

Y. B. Xu; C. A. F. Vaz; A. Hirohata; C. C. Yao; W. Y. Lee; J. A. C. Bland; F. Rousseaux; E. Cambril; H. Launois

Domain wall trapping probed by MR and MFM in submicron ferromagnetic wire structures

Y. B. Xu, C. A. F. Vaz, A. Hirohata, C. C. Yao, W. Y. Lee, J. A. C. Bland, F. Rousseaux, E. Cambril, H. Launois

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Pages (from-to)	6178
Number of pages	1
Journal	J. App. Phys.
Volume	85
Publication status	Published - 1999

Cite this

@article{512e8d172c8a46eda38fb20657c693c4,

title = "Domain wall trapping probed by MR and MFM in submicron ferromagnetic wire structures",

author = "Xu, {Y. B.} and Vaz, {C. A. F.} and A. Hirohata and Yao, {C. C.} and Lee, {W. Y.} and Bland, {J. A. C.} and F. Rousseaux and E. Cambril and H. Launois",

year = "1999",

language = "Undefined/Unknown",

volume = "85",

pages = "6178",

journal = "J. App. Phys.",

}