Dynamic equivalent circuit modelling of polycrystalline silicon photovoltaic cells

Olufemi I. Olayiwola, Paul S. Barendse

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper is focused on the dynamic modelling of the polycrystalline silicon wafer-based photovoltaic cells under various operational and fault conditions. The models are drawn from the impedance changes observed using electrochemical impedance spectroscopy. In this paper, tests were carried out at different voltage bias levels under illumination, dark, uniform partial shading, and cell-mismatch conditions. The cell model parameters are extracted from the obtained Nyquist plots and fitted to appropriate equivalent circuits. Results obtained show that, the variations of the AC model parameters can be used for in-line characterization and real-time condition monitoring of the photovoltaic cells/arrays under the different operational and fault conditions.

Original languageEnglish
Title of host publication2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages2310-2317
Number of pages8
ISBN (Electronic)9781509029983
DOIs
Publication statusPublished - 3 Nov 2017
Event9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017 - Cincinnati, United States
Duration: 1 Oct 20175 Oct 2017

Publication series

Name2017 IEEE Energy Conversion Congress and Exposition, ECCE 2017
Volume2017-January

Conference

Conference9th Annual IEEE Energy Conversion Congress and Exposition, ECCE 2017
Country/TerritoryUnited States
CityCincinnati
Period1/10/175/10/17

Bibliographical note

Publisher Copyright:
© 2017 IEEE.

Keywords

  • Equivalent circuit model
  • Impedance
  • Photovoltaic
  • Polycrystalline silicon
  • Spectroscopy

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