Effect of high temperature ageing on electromagnetic emissions from a PIC microcontroller

J. F. Dawson*, I. D. Flintoft, A. P. Duffy, A. C. Marvin, M. P. Robinson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

This paper describes the effect of high temperature ageing on the electromagnetic emissions of a number of PIC microcontrollers. The aged devices show a measureable shift in the frequency of emissions. Shift in the voltage-current characteristics of the device output pins has also been observed.

Original languageEnglish
Title of host publicationElectromagnetic Compatibility (EMC Europe), 2014 International Symposium on
PublisherIEEE
Pages1139-1143
Number of pages5
ISBN (Print)9781479932252
DOIs
Publication statusPublished - 23 Oct 2014
Event2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014 - Gothenburg, United Kingdom
Duration: 1 Sept 20144 Sept 2014

Conference

Conference2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014
Country/TerritoryUnited Kingdom
CityGothenburg
Period1/09/144/09/14

Bibliographical note

© IEEE, 2014. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details

Keywords

  • ageing
  • microcontroller
  • radiated emissions

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