Effect of high temperature ageing on electromagnetic emissions from a PIC microcontroller

J. F. Dawson*, I. D. Flintoft, A. P. Duffy, A. C. Marvin, M. P. Robinson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution


This paper describes the effect of high temperature ageing on the electromagnetic emissions of a number of PIC microcontrollers. The aged devices show a measureable shift in the frequency of emissions. Shift in the voltage-current characteristics of the device output pins has also been observed.

Original languageEnglish
Title of host publicationElectromagnetic Compatibility (EMC Europe), 2014 International Symposium on
Number of pages5
ISBN (Print)9781479932252
Publication statusPublished - 23 Oct 2014
Event2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014 - Gothenburg, United Kingdom
Duration: 1 Sept 20144 Sept 2014


Conference2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014
Country/TerritoryUnited Kingdom

Bibliographical note

© IEEE, 2014. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details


  • ageing
  • microcontroller
  • radiated emissions

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