Effect of high temperature ageing on electromagnetic emissions from a PIC microcontroller

TY - GEN

T1 - Effect of high temperature ageing on electromagnetic emissions from a PIC microcontroller

AU - Dawson, J. F.

AU - Flintoft, I. D.

AU - Duffy, A. P.

AU - Marvin, A. C.

AU - Robinson, M. P.

N1 - © IEEE, 2014. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details

PY - 2014/10/23

Y1 - 2014/10/23

N2 - This paper describes the effect of high temperature ageing on the electromagnetic emissions of a number of PIC microcontrollers. The aged devices show a measureable shift in the frequency of emissions. Shift in the voltage-current characteristics of the device output pins has also been observed.

AB - This paper describes the effect of high temperature ageing on the electromagnetic emissions of a number of PIC microcontrollers. The aged devices show a measureable shift in the frequency of emissions. Shift in the voltage-current characteristics of the device output pins has also been observed.

KW - ageing

KW - microcontroller

KW - radiated emissions

UR - http://www.scopus.com/inward/record.url?scp=84908695939&partnerID=8YFLogxK

U2 - 10.1109/EMCEurope.2014.6931074

DO - 10.1109/EMCEurope.2014.6931074

M3 - Conference contribution

AN - SCOPUS:84908695939

SN - 9781479932252

SP - 1139

EP - 1143

BT - Electromagnetic Compatibility (EMC Europe), 2014 International Symposium on

PB - IEEE

T2 - 2014 International Symposium on Electromagnetic Compatibility, EMC Europe 2014

Y2 - 1 September 2014 through 4 September 2014

ER -