Effect of junction geometry on switching field and reversal behavior in permalloy wires

W. Y. Lee; Y. B. Xu; C. A. F. Vaz; H. T. Leung; A. Hirohata; J. A. C. Bland; F. Rousseaux; E. Cambril; H. Launois

Effect of junction geometry on switching field and reversal behavior in permalloy wires

W. Y. Lee, Y. B. Xu, C. A. F. Vaz, H. T. Leung, A. Hirohata, J. A. C. Bland, F. Rousseaux, E. Cambril, H. Launois

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Original language	Undefined/Unknown
Pages (from-to)	3883
Number of pages	1
Journal	IEEE Trans. on Magn.
Volume	35
Publication status	Published - 1999

Cite this

@article{5803052c5cb04ac581585b704c3b19f2,

title = "Effect of junction geometry on switching field and reversal behavior in permalloy wires",

author = "Lee, {W. Y.} and Xu, {Y. B.} and Vaz, {C. A. F.} and Leung, {H. T.} and A. Hirohata and Bland, {J. A. C.} and F. Rousseaux and E. Cambril and H. Launois",

year = "1999",

language = "Undefined/Unknown",

volume = "35",

pages = "3883",

journal = "IEEE Trans. on Magn.",

}

TY - JOUR

T1 - Effect of junction geometry on switching field and reversal behavior in permalloy wires

AU - Lee, W. Y.

AU - Xu, Y. B.

AU - Vaz, C. A. F.

AU - Leung, H. T.

AU - Hirohata, A.

AU - Bland, J. A. C.

AU - Rousseaux, F.

AU - Cambril, E.

AU - Launois, H.

PY - 1999

Y1 - 1999

M3 - Article

VL - 35

SP - 3883

JO - IEEE Trans. on Magn.

JF - IEEE Trans. on Magn.

ER -