By the same authors

From the same journal

Efficient alignment and correspondence using edit distance

Research output: Contribution to journalArticlepeer-review

Author(s)

  • P Bergamini
  • L Cinque
  • A D J Cross
  • E R Hancock
  • S Levialdi
  • R Myers

Department/unit(s)

Publication details

JournalADVANCES IN PATTERN RECOGNITION
DatePublished - 2000
Volume1876
Number of pages10
Pages (from-to)246-255
Original languageEnglish

Abstract

This paper presents work aimed at rendering the dual-step EM algorithm of Cross and Hancock more efficient. The original algorithm integrates the processes of point-set alignment and correspondence. The consistency of the pattern of correspondence matches on the Delaunay triangulation of the points is used to gate contributions to the expected log-likelihood function for point-set alignment parameters. However, in its original form the algorithm uses a dictionary of structure-preserving mappings to asses the consistency of match. This proves to be a serious computational bottleneck. In this paper, we show how graph edit-distance can be used to compute the correspondence probabilities more efficiently. In a sensitivity analysis, we show that the edit distance method is not only more efficient, it is also more accurate than the dictionary-based method.

    Research areas

  • EM ALGORITHM, RECOGNITION, POINT

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