Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress

Evan Dimech, John Frederick Dawson

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Finished

1 results

Finished

EMS: Electromagnetic Monitoring of Semiconductor Ageing
Dawson, J. F. (Principal investigator), Flintoft, I. D. (Co-investigator) & Dimech, E. (Student)
1/10/14 → 1/10/20
Project: Other project › Miscellaneous project