Electrical Parameters Characterization of Aged IGBTs by Thermo-Electrical Overstress

Evan Dimech, John Frederick Dawson

Electronic Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Finished

1 results

Finished

EMS: Electromagnetic Monitoring of Semiconductor Ageing
Dawson, J. F., Flintoft, I. D. & Dimech, E.
1/10/14 → 1/10/20
Project: Other project › Miscellaneous project