Electromagnetic Monitoring of Semiconductor Ageing

A.P. Duffy; J.F. Dawson; I.D. Flintoft; A.C. Marvin

doi:10.1016/j.procir.2014.07.130

Electromagnetic Monitoring of Semiconductor Ageing

A.P. Duffy, J.F. Dawson, I.D. Flintoft, A.C. Marvin

Electronic Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	98 - 102
Journal	Procedia CIRP
Volume	22
DOIs	https://doi.org/10.1016/j.procir.2014.07.130
Publication status	Published - 2014
Event	3rd International Conference in Through-life Engineering Services - , United Kingdom Duration: 4 Nov 2013 → 5 Nov 2013

Bibliographical note

© Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services

Keywords

Intermodulation
Electromagnetic Compatibility
Semiconductor Ageing
Failure prediction
Through life monitoring

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10.1016/j.procir.2014.07.130

Electromagnetic Monitoring of Semiconductor Ageing
© Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence.
Final published version, 925 KB

2 Finished
3 Active

Non-linear Electromagnetic interactions
Dawson, J. F., Robinson, M. P., Flintoft, I. D., Marvin, A., Dawson, L. & Porter, S. J.
1/01/93 → …
Project: Other project › Miscellaneous project
Electromagnetic compatibility of electronic circuits and systems
Dawson, J. F., Robinson, M. P., Porter, S. J., Marvin, A. & Flintoft, I. D.
1/01/90 → …
Project: Other project › Miscellaneous project
Antennas, Electromagnetic test cells, and metrology
Marvin, A., Porter, S. J., Dawson, J. F., Robinson, M. P., Flintoft, I. D., Clegg, J. & Dawson, L.
1/01/80 → …
Project: Other project › Miscellaneous project

Cite this

@article{9a88c332ec154e54965a09e9863f94db,

title = "Electromagnetic Monitoring of Semiconductor Ageing",

keywords = "Intermodulation, Electromagnetic Compatibility, Semiconductor Ageing, Failure prediction, Through life monitoring",

author = "A.P. Duffy and J.F. Dawson and I.D. Flintoft and A.C. Marvin",

note = "{\textcopyright} Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services; 3rd International Conference in Through-life Engineering Services ; Conference date: 04-11-2013 Through 05-11-2013",

year = "2014",

doi = "10.1016/j.procir.2014.07.130",

language = "English",

volume = "22",

pages = "98 -- 102",

journal = "Procedia CIRP",

issn = "2212-8271",

publisher = "Elsevier",

}

TY - JOUR

T1 - Electromagnetic Monitoring of Semiconductor Ageing

AU - Duffy, A.P.

AU - Dawson, J.F.

AU - Flintoft, I.D.

AU - Marvin, A.C.

N1 - © Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services

PY - 2014

Y1 - 2014

KW - Intermodulation

KW - Electromagnetic Compatibility

KW - Semiconductor Ageing

KW - Failure prediction

KW - Through life monitoring

U2 - 10.1016/j.procir.2014.07.130

DO - 10.1016/j.procir.2014.07.130

M3 - Article

VL - 22

SP - 98

EP - 102

JO - Procedia CIRP

JF - Procedia CIRP

SN - 2212-8271

T2 - 3rd International Conference in Through-life Engineering Services

Y2 - 4 November 2013 through 5 November 2013

ER -

Electromagnetic Monitoring of Semiconductor Ageing

Bibliographical note

Keywords

Access to Document

Projects

Non-linear Electromagnetic interactions

Electromagnetic compatibility of electronic circuits and systems

Antennas, Electromagnetic test cells, and metrology

Cite this