Electromagnetic Monitoring of Semiconductor Ageing

A.P. Duffy; J.F. Dawson; I.D. Flintoft; A.C. Marvin

doi:10.1016/j.procir.2014.07.130

Electromagnetic Monitoring of Semiconductor Ageing

A.P. Duffy, J.F. Dawson, I.D. Flintoft, A.C. Marvin

Engineering

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	98 - 102
Journal	Procedia CIRP
Volume	22
DOIs	https://doi.org/10.1016/j.procir.2014.07.130
Publication status	Published - 2014
Event	3rd International Conference in Through-life Engineering Services - , United Kingdom Duration: 4 Nov 2013 → 5 Nov 2013

Bibliographical note

© Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services

Keywords

Intermodulation
Electromagnetic Compatibility
Semiconductor Ageing
Failure prediction
Through life monitoring

Access to Document

10.1016/j.procir.2014.07.130

Electromagnetic Monitoring of Semiconductor Ageing
© Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence.
Final published version, 925 KB

2 Finished
3 Active

Non-linear Electromagnetic interactions
DAWSON, J. (Co-investigator), ROBINSON, M. (Co-investigator), FLINTOFT, I. (Co-investigator), MARVIN, A. (Co-investigator), DAWSON, L. (Co-investigator) & PORTER, S. (Co-investigator)
1/01/93 → …
Project: Other project › Miscellaneous project
Electromagnetic compatibility of electronic circuits and systems
DAWSON, J. (Principal investigator), ROBINSON, M. (Principal investigator), PORTER, S. (Principal investigator), MARVIN, A. (Principal investigator) & FLINTOFT, I. (Principal investigator)
1/01/90 → …
Project: Other project › Miscellaneous project
Antennas, Electromagnetic test cells, and metrology
MARVIN, A. (Principal investigator), PORTER, S. (Principal investigator), DAWSON, J. (Principal investigator), ROBINSON, M. (Principal investigator), FLINTOFT, I. (Researcher), CLEGG, J. (Researcher) & DAWSON, L. (Researcher)
1/01/80 → …
Project: Other project › Miscellaneous project

Cite this

@article{9a88c332ec154e54965a09e9863f94db,

title = "Electromagnetic Monitoring of Semiconductor Ageing",

keywords = "Intermodulation, Electromagnetic Compatibility, Semiconductor Ageing, Failure prediction, Through life monitoring",

author = "A.P. Duffy and J.F. Dawson and I.D. Flintoft and A.C. Marvin",

note = "{\textcopyright} Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services; 3rd International Conference in Through-life Engineering Services ; Conference date: 04-11-2013 Through 05-11-2013",

year = "2014",

doi = "10.1016/j.procir.2014.07.130",

language = "English",

volume = "22",

pages = "98 -- 102",

journal = "Procedia CIRP",

issn = "2212-8271",

publisher = "Elsevier B.V.",

}

TY - JOUR

T1 - Electromagnetic Monitoring of Semiconductor Ageing

AU - Duffy, A.P.

AU - Dawson, J.F.

AU - Flintoft, I.D.

AU - Marvin, A.C.

N1 - © Published by Elsevier BV 2014. This content is made available by the publisher under a Creative Commons CC BY-NC-ND Licence. Issue title: Proceedings of the 3rd International Conference in Through-life Engineering Services

PY - 2014

Y1 - 2014

KW - Intermodulation

KW - Electromagnetic Compatibility

KW - Semiconductor Ageing

KW - Failure prediction

KW - Through life monitoring

U2 - 10.1016/j.procir.2014.07.130

DO - 10.1016/j.procir.2014.07.130

M3 - Article

SN - 2212-8271

VL - 22

SP - 98

EP - 102

JO - Procedia CIRP

JF - Procedia CIRP

T2 - 3rd International Conference in Through-life Engineering Services

Y2 - 4 November 2013 through 5 November 2013

ER -

Electromagnetic Monitoring of Semiconductor Ageing

Bibliographical note

Keywords

Access to Document

Projects

Non-linear Electromagnetic interactions

Electromagnetic compatibility of electronic circuits and systems

Antennas, Electromagnetic test cells, and metrology

Cite this