Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

M. Bodik; M. Demydenko; C. G.H. Walker; T. Bahler; T. Michlmayr; A. K. Thamm; U. Ramsperger; A. Pratt; S. P. Tear; M. M. El Gomati; D. Pescia

doi:10.1109/IVNC52431.2021.9600768

Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

M. Bodik, M. Demydenko, C. G.H. Walker^*, T. Bahler, T. Michlmayr, A. K. Thamm, U. Ramsperger, A. Pratt, S. P. Tear, M. M. El Gomati, D. Pescia

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (φ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of φ in greater detail, a sample of W(110) (φ = 5.25 eV) and a sample of Cs deposited on W(110) (φ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing"have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.

Original language	English
Title of host publication	2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021
Editors	Stephen Purcell, Jean-Paul Mazellier
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781665425896
DOIs	https://doi.org/10.1109/IVNC52431.2021.9600768
Publication status	Published - 17 Nov 2021
Event	34th International Vacuum Nanoelectronics Conference, IVNC 2021 - Virtual, Lyon, France Duration: 5 Jul 2021 → 9 Jul 2021

Publication series

Name	2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021

Conference

Conference	34th International Vacuum Nanoelectronics Conference, IVNC 2021
Country/Territory	France
City	Virtual, Lyon
Period	5/07/21 → 9/07/21

Bibliographical note

Publisher Copyright:
© 2021 IEEE.

Keywords

Cesium
EELS
Field Emission
STM
Tungsten
Work Function

Access to Document

10.1109/IVNC52431.2021.9600768

Cite this

Bodik, M., Demydenko, M., Walker, C. G. H., Bahler, T., Michlmayr, T., Thamm, A. K., Ramsperger, U., Pratt, A., Tear, S. P., El Gomati, M. M., & Pescia, D. (2021). Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer. In S. Purcell, & J.-P. Mazellier (Eds.), 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021 Article 9600768 (2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IVNC52431.2021.9600768

Bodik, M. ; Demydenko, M. ; Walker, C. G.H. et al. / Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer. 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021. editor / Stephen Purcell ; Jean-Paul Mazellier. Institute of Electrical and Electronics Engineers Inc., 2021. (2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021).

@inproceedings{02f175f6782b4cc6a0a6282c4fb08186,

title = "Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer",

abstract = "In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (φ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of φ in greater detail, a sample of W(110) (φ = 5.25 eV) and a sample of Cs deposited on W(110) (φ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical {"}bouncing{"}have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.",

keywords = "Cesium, EELS, Field Emission, STM, Tungsten, Work Function",

author = "M. Bodik and M. Demydenko and Walker, {C. G.H.} and T. Bahler and T. Michlmayr and Thamm, {A. K.} and U. Ramsperger and A. Pratt and Tear, {S. P.} and {El Gomati}, {M. M.} and D. Pescia",

note = "Publisher Copyright: {\textcopyright} 2021 IEEE.; 34th International Vacuum Nanoelectronics Conference, IVNC 2021 ; Conference date: 05-07-2021 Through 09-07-2021",

year = "2021",

month = nov,

day = "17",

doi = "10.1109/IVNC52431.2021.9600768",

language = "English",

series = "2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

editor = "Stephen Purcell and Jean-Paul Mazellier",

booktitle = "2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021",

address = "United States",

}

Bodik, M, Demydenko, M, Walker, CGH, Bahler, T, Michlmayr, T, Thamm, AK, Ramsperger, U, Pratt, A , Tear, SP , El Gomati, MM & Pescia, D 2021, Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer. in S Purcell & J-P Mazellier (eds), 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021., 9600768, 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021, Institute of Electrical and Electronics Engineers Inc., 34th International Vacuum Nanoelectronics Conference, IVNC 2021, Virtual, Lyon, France, 5/07/21. https://doi.org/10.1109/IVNC52431.2021.9600768

Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer. / Bodik, M.; Demydenko, M.; Walker, C. G.H. et al.
2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021. ed. / Stephen Purcell; Jean-Paul Mazellier. Institute of Electrical and Electronics Engineers Inc., 2021. 9600768 (2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

AU - Bodik, M.

AU - Demydenko, M.

AU - Walker, C. G.H.

AU - Bahler, T.

AU - Michlmayr, T.

AU - Thamm, A. K.

AU - Ramsperger, U.

AU - Pratt, A.

AU - Tear, S. P.

AU - El Gomati, M. M.

AU - Pescia, D.

PY - 2021/11/17

Y1 - 2021/11/17

N2 - In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (φ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of φ in greater detail, a sample of W(110) (φ = 5.25 eV) and a sample of Cs deposited on W(110) (φ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing"have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.

AB - In this study, we use Scanning Field Emission Microscopy (SFEM) combined with a miniature electron energy analyzer known as a Bessel box to measure electron energy spectra emitted from a sample. Previous studies using SFEM have revealed that the work function (φ) of the material under study has a significant role to play in the formation of the signal intensity. Hence, in order to understand the role of φ in greater detail, a sample of W(110) (φ = 5.25 eV) and a sample of Cs deposited on W(110) (φ ≈ 1.7 eV) were investigated. STM images show that the Cs covered surface has a speckled appearance indicating small Cs islands. The electron energy loss spectra obtained (which are the first using the Bessel box in SFEM) show differing structure in the elastic peak region. Monte Carlo (MC) simulations including quantum mechanical "bouncing"have been carried out. The results are consistent with MC simulations of the electrons escaping from the tip-sample junction.

KW - Cesium

KW - EELS

KW - Field Emission

KW - STM

KW - Tungsten

KW - Work Function

UR - http://www.scopus.com/inward/record.url?scp=85123364099&partnerID=8YFLogxK

U2 - 10.1109/IVNC52431.2021.9600768

DO - 10.1109/IVNC52431.2021.9600768

M3 - Conference contribution

AN - SCOPUS:85123364099

T3 - 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021

BT - 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021

A2 - Purcell, Stephen

A2 - Mazellier, Jean-Paul

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 34th International Vacuum Nanoelectronics Conference, IVNC 2021

Y2 - 5 July 2021 through 9 July 2021

ER -

Bodik M, Demydenko M, Walker CGH, Bahler T, Michlmayr T, Thamm AK et al. Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer. In Purcell S, Mazellier JP, editors, 2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021. Institute of Electrical and Electronics Engineers Inc. 2021. 9600768. (2021 34th International Vacuum Nanoelectronics Conference, IVNC 2021). doi: 10.1109/IVNC52431.2021.9600768

Electron energy analysis in Scanning Field Emission Microscopy using a Bessel box energy analyzer

Abstract

Publication series

Conference

Bibliographical note

Keywords

Access to Document

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