Exchange bias induced at a Co2FeAl0.5Si0.5/Cr interface

Chris Nga Tung Yu, Andrew James Vick, Nobuhito Inami, Kanta Ono, William Frost, Atsufumi Hirohata

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In order to engineer the strength of an exchange bias in a cubic Heusler alloy layer, crystalline strain has been induced at a ferromagnet/antiferromagnet interface by their lattice mismatch in addition to the conventional interfacial exchange coupling between them. Such interfaces have been formed in (Co2FeAl0.5Si0.5(CFAS)/Cr)3 structures grown by ultrahigh vacuum molecular beam epitaxy. The magnetic and structural properties have been characterised to investigate the exchange interactions at the CFAS/Cr interfaces. Due to the interfacial lattice mismatch of 1.4%, the maximum offset of 18 Oe in a magnetisation curve has been measured for the case of a CFAS (2 nm)/Cr (0.9 nm) interface at 193 K. The half-metallic property of CFAS has been observed to remain unchanged, which agrees with the theoretical prediction by Culbert et al (2008 J. Appl. Phys. 103 07D707). Such a strain-induced exchange bias may provide insight of the interfacial interactions and may offer a wide flexibility in spintronic device design.
Original languageEnglish
Article number125004
Pages (from-to)1-6
Number of pages6
JournalJournal of Physics D: Applied Physics
Issue number12
Publication statusPublished - 27 Feb 2017

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