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From the same journal

Femtosecond X-Ray Diffraction Studies of the Reversal of the Microstructural Effects of Plastic Deformation during Shock Release of Tantalum

Research output: Contribution to journalArticle

Author(s)

  • M. Sliwa
  • David McGonegle
  • C. E. Wehrenberg
  • C. Bolme
  • Patrick Heighway
  • Andrew Higginbotham
  • A. E. Lazicki
  • Hae Ja Lee
  • Bob Nagler
  • H. S. Park
  • R. E. Rudd
  • Matthew J. Suggit
  • D. C. Swift
  • F. Tavella
  • L. Zepeda-Ruiz
  • Bruce A. Remington
  • J S Wark

Department/unit(s)

Publication details

JournalPhysical Review Letters
DateAccepted/In press - 18 Apr 2018
DatePublished (current) - 29 Jun 2018
Issue number26
Volume120
Original languageEnglish

Abstract

We have used femtosecond x-ray diffraction (XRD) to study laser-shocked fiber-textured polycrystalline tantalum targets as the 37-253 GPa shock waves break out from the free surface. We extract the time and depth-dependent strain profiles within the Ta target as the rarefaction wave travels back into the bulk of the sample. In agreement with molecular dynamics (MD) simulations the lattice rotation and the twins that are formed under shock-compression are observed to be almost fully eliminated by the rarefaction process.

Bibliographical note

© 2018 American Physical Society. This is an author-produced version of the published paper. Uploaded in accordance with the publisher’s self-archiving policy. Further copying may not be permitted; contact the publisher for details

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