Growth and characterisation of ferromagnetic and antiferromagnetic Fe
            2+xV
            yAl Heusler alloy films

Teodor Huminiuc; Oliver Samuel Whear; Tomoyuki Takahashi; Jun-Young Kim; Andrew James Vick; Gonzalo Vallejo Fernandez; Kevin Dermot O'Grady; Atsufumi Hirohata

doi:10.1088/1361-6463/aacf4c

Growth and characterisation of ferromagnetic and antiferromagnetic Fe _2+xV _yAl Heusler alloy films

Teodor Huminiuc, Oliver Samuel Whear, Tomoyuki Takahashi, Jun-Young Kim, Andrew James Vick, Gonzalo Vallejo Fernandez, Kevin Dermot O'Grady, Atsufumi Hirohata

Research output: Contribution to journal › Article › peer-review

Abstract

We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe _2+xV _yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe ₂VAl and Fe ₃VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe ₃VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe _2.5V _0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe _2.3V _0.7Al/Co ₆₀Fe ₄₀ system at 100 K.

Original language	English
Article number	325003
Number of pages	5
Journal	Journal of Physics D: Applied Physics
Volume	51
Issue number	32
DOIs	https://doi.org/10.1088/1361-6463/aacf4c
Publication status	Published - 13 Jul 2018

Keywords

Fe2VAl
Heusler alloys
antiferromagnet
exchange bias
spintronics
sputtering
x-ray diffraction

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Fe2VAl_180611_ahAccepted author manuscript, 5.79 MB
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title = "Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films",

abstract = "We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.",

keywords = "Fe2VAl, Heusler alloys, antiferromagnet, exchange bias, spintronics, sputtering, x-ray diffraction",

author = "Teodor Huminiuc and Whear, {Oliver Samuel} and Tomoyuki Takahashi and Jun-Young Kim and Vick, {Andrew James} and {Vallejo Fernandez}, Gonzalo and O'Grady, {Kevin Dermot} and Atsufumi Hirohata",

year = "2018",

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doi = "10.1088/1361-6463/aacf4c",

language = "English",

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journal = "Journal of Physics D: Applied Physics",

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TY - JOUR

T1 - Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films

AU - Huminiuc, Teodor

AU - Whear, Oliver Samuel

AU - Takahashi, Tomoyuki

AU - Kim, Jun-Young

AU - Vick, Andrew James

AU - Vallejo Fernandez, Gonzalo

AU - O'Grady, Kevin Dermot

AU - Hirohata, Atsufumi

PY - 2018/7/13

Y1 - 2018/7/13

N2 - We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.

AB - We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.

KW - Fe2VAl

KW - Heusler alloys

KW - antiferromagnet

KW - exchange bias

KW - spintronics

KW - sputtering

KW - x-ray diffraction

UR - http://www.scopus.com/inward/record.url?scp=85050817943&partnerID=8YFLogxK

U2 - 10.1088/1361-6463/aacf4c

DO - 10.1088/1361-6463/aacf4c

M3 - Article

SN - 1361-6463

VL - 51

JO - Journal of Physics D: Applied Physics

JF - Journal of Physics D: Applied Physics

IS - 32

M1 - 325003

ER -

Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films

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Keywords

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Growth and characterisation of ferromagnetic and antiferromagnetic Fe _2+xV _yAl Heusler alloy films