Growth and characterisation of ferromagnetic and antiferromagnetic Fe 2+xV yAl Heusler alloy films

Teodor Huminiuc, Oliver Samuel Whear, Tomoyuki Takahashi, Jun-Young Kim, Andrew James Vick, Gonzalo Vallejo Fernandez, Kevin Dermot O'Grady, Atsufumi Hirohata

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We investigated growth, annealing conditions and magnetic properties of the Heusler alloy Fe 2+xV yAl by means of x-ray diffraction, magnetic hysteresis and exchange-bias measurements. Ferromagnetic Heusler alloy films were obtained by sputtering Fe 2VAl and Fe 3VAl targets and performing post-growth annealing. The characteristic (2 2 0) Heusler alloy peaks were seen in the x-ray diffraction measurements and corresponding ferromagnetic behaviours were observed. In addition, antiferromagnetic Heusler alloy films were deposited by employing Al pegs on Fe 3VAl sputtering targets. The deposited films had elemental ratios close to the predicted Fe 2.5V 0.5Al phase, and a 16 Oe exchange-bias was measured in a Fe 2.3V 0.7Al/Co 60Fe 40 system at 100 K.

Original languageEnglish
Article number325003
Number of pages5
JournalJournal of Physics D: Applied Physics
Issue number32
Publication statusPublished - 13 Jul 2018


  • Fe2VAl
  • Heusler alloys
  • antiferromagnet
  • exchange bias
  • spintronics
  • sputtering
  • x-ray diffraction

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