High-precision soft x-ray polarimeter at Diamond Light Source

H. Wang; S.S. Dhesi; F. MacCherozzi; S. Cavill; E. Shepherd; F. Yuan; R. Deshmukh; S. Scott; G. Van Der Laan; K.J.S. Sawhney

doi:10.1063/1.3665928

High-precision soft x-ray polarimeter at Diamond Light Source

H. Wang, S.S. Dhesi, F. MacCherozzi, S. Cavill, E. Shepherd, F. Yuan, R. Deshmukh, S. Scott, G. Van Der Laan, K.J.S. Sawhney

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

The development and performance of a high-precision polarimeter for the polarization analysis in the soft x-ray region is presented. This versatile, high-vacuum compatible instrument is supported on a hexapod to simplify the alignment with a resolution less than 5 μrad, and can be moved with its own independent control system easily between different beamlines and synchrotron facilities. The polarimeter can also be used for the characterization of reflection and transmission properties of optical elements. A WB C multilayer phase retarder was used to characterize the polarization state up to 1200 eV. A fast and accurate alignment procedure was developed, and complete polarization analysis of the APPLE II undulator at 712 eV has been performed.

Original language	English
Journal	Review of Scientific Instruments
Volume	82
Issue number	12
DOIs	https://doi.org/10.1063/1.3665928
Publication status	Published - 1 Dec 2011

Access to Document

10.1063/1.3665928

Cite this

@article{729d581443854a1780b3d168a1c4f890,

title = "High-precision soft x-ray polarimeter at Diamond Light Source",

abstract = "The development and performance of a high-precision polarimeter for the polarization analysis in the soft x-ray region is presented. This versatile, high-vacuum compatible instrument is supported on a hexapod to simplify the alignment with a resolution less than 5 μrad, and can be moved with its own independent control system easily between different beamlines and synchrotron facilities. The polarimeter can also be used for the characterization of reflection and transmission properties of optical elements. A WB C multilayer phase retarder was used to characterize the polarization state up to 1200 eV. A fast and accurate alignment procedure was developed, and complete polarization analysis of the APPLE II undulator at 712 eV has been performed.",

author = "H. Wang and S.S. Dhesi and F. MacCherozzi and S. Cavill and E. Shepherd and F. Yuan and R. Deshmukh and S. Scott and {Van Der Laan}, G. and K.J.S. Sawhney",

year = "2011",

month = dec,

day = "1",

doi = "10.1063/1.3665928",

language = "English",

volume = "82",

journal = "Review of Scientific Instruments",

issn = "0034-6748",

publisher = "American Institute of Physics",

number = "12",

}

TY - JOUR

T1 - High-precision soft x-ray polarimeter at Diamond Light Source

AU - Wang, H.

AU - Dhesi, S.S.

AU - MacCherozzi, F.

AU - Cavill, S.

AU - Shepherd, E.

AU - Yuan, F.

AU - Deshmukh, R.

AU - Scott, S.

AU - Van Der Laan, G.

AU - Sawhney, K.J.S.

PY - 2011/12/1

Y1 - 2011/12/1

N2 - The development and performance of a high-precision polarimeter for the polarization analysis in the soft x-ray region is presented. This versatile, high-vacuum compatible instrument is supported on a hexapod to simplify the alignment with a resolution less than 5 μrad, and can be moved with its own independent control system easily between different beamlines and synchrotron facilities. The polarimeter can also be used for the characterization of reflection and transmission properties of optical elements. A WB C multilayer phase retarder was used to characterize the polarization state up to 1200 eV. A fast and accurate alignment procedure was developed, and complete polarization analysis of the APPLE II undulator at 712 eV has been performed.

AB - The development and performance of a high-precision polarimeter for the polarization analysis in the soft x-ray region is presented. This versatile, high-vacuum compatible instrument is supported on a hexapod to simplify the alignment with a resolution less than 5 μrad, and can be moved with its own independent control system easily between different beamlines and synchrotron facilities. The polarimeter can also be used for the characterization of reflection and transmission properties of optical elements. A WB C multilayer phase retarder was used to characterize the polarization state up to 1200 eV. A fast and accurate alignment procedure was developed, and complete polarization analysis of the APPLE II undulator at 712 eV has been performed.

UR - http://www.scopus.com/inward/record.url?scp=84855310160&partnerID=8YFLogxK

U2 - 10.1063/1.3665928

DO - 10.1063/1.3665928

M3 - Article

AN - SCOPUS:84855310160

SN - 0034-6748

VL - 82

JO - Review of Scientific Instruments

JF - Review of Scientific Instruments

IS - 12

ER -

High-precision soft x-ray polarimeter at Diamond Light Source

Abstract

Access to Document

Other files and links

Cite this