IGBT'S AGEING AND ITS IMPACTS ON THE EM CONDUCTED EMISSIONS

TY - GEN

T1 - IGBT'S AGEING AND ITS IMPACTS ON THE EM CONDUCTED EMISSIONS

AU - Dimech, E

AU - Dawson, J F

N1 - This is an author-produced version of the published paper. Uploaded in accordance with the University’s Research Publications and Open Access policy.

PY - 2024/9/2

Y1 - 2024/9/2

N2 - IGBTs play crucial roles in various power electronic applications, demanding reliability over extended periods. Understanding their failure mechanisms is vital for manufacturers and engineers. This study addresses gaps by correlating IGBT degradation, particularly die-attach and gate oxide contamination, with conducted electromagnetic (EM) disturbances. Accelerated aging was conducted on 600V, 16A IGBTs using a power cycling system, revealing significant changes in static and dynamic parameters. Switching transients showed a slowdown in turn-off, attributed to the experienced degradation. Experimental setups demonstrated a direct link between degradation, switching transients, especially collector current (IC) turn-off, and reduced conducted EM disturbances.

AB - IGBTs play crucial roles in various power electronic applications, demanding reliability over extended periods. Understanding their failure mechanisms is vital for manufacturers and engineers. This study addresses gaps by correlating IGBT degradation, particularly die-attach and gate oxide contamination, with conducted electromagnetic (EM) disturbances. Accelerated aging was conducted on 600V, 16A IGBTs using a power cycling system, revealing significant changes in static and dynamic parameters. Switching transients showed a slowdown in turn-off, attributed to the experienced degradation. Experimental setups demonstrated a direct link between degradation, switching transients, especially collector current (IC) turn-off, and reduced conducted EM disturbances.

M3 - Conference contribution

T3 - EMC Europe

BT - EMC Europe 2024

ER -