In situ double aberration corrected (S)TEM system

Research output: Chapter in Book/Report/Conference proceedingChapter

Original languageEnglish
Title of host publicationEMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
Subtitle of host publicationVol 1: Instrumentation and Methods
EditorsM Luysberg, K Tillmann, T Weirich
ISBN (Print)978-3-540-85154-7
Publication statusPublished - 2008

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