In situ double aberration corrected (S)TEM system

Research output: Chapter in Book/Report/Conference proceeding › Chapter

Original language	English
Title of host publication	EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany
Subtitle of host publication	Vol 1: Instrumentation and Methods
Editors	M Luysberg, K Tillmann, T Weirich
Publisher	Springer
Volume	1
ISBN (Print)	978-3-540-85154-7
Publication status	Published - 2008

Cite this

@inbook{5eac2d8ea66b4b169911ebc0ea273671,

title = "In situ double aberration corrected (S)TEM system",

author = "Gai, {Pratibha L}",

year = "2008",

language = "English",

isbn = "978-3-540-85154-7",

volume = "1",

editor = "M Luysberg and K Tillmann and T Weirich",

booktitle = "EMC 2008 14th European Microscopy Congress 1-5 September 2008, Aachen, Germany",

publisher = "Springer",

address = "Germany",

}