Infrared metrology for spintronic materials and devices

M. Vopsaroiu; T. Stanton; O. Thomas; M. Cain; S. M. Thompson

doi:10.1088/0957-0233/20/4/045109

Infrared metrology for spintronic materials and devices

M. Vopsaroiu, T. Stanton, O. Thomas, M. Cain, S. M. Thompson

Physics

Research output: Contribution to journal › Article › peer-review

Abstract

Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.

Original language	English
Article number	045109
Pages (from-to)	-
Number of pages	5
Journal	Measurement Science and Technology
Volume	20
Issue number	4
DOIs	https://doi.org/10.1088/0957-0233/20/4/045109
Publication status	Published - Apr 2009

Keywords

magneto-refractive effect
non-contact GMR
IR reflectivity
GIANT MAGNETORESISTANCE
GRANULAR FILMS
CONTACTLESS MEASUREMENT
SPIN VALVES
SPECTROSCOPY
SPECTRA

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10.1088/0957-0233/20/4/045109

Cite this

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title = "Infrared metrology for spintronic materials and devices",

abstract = "Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.",

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T1 - Infrared metrology for spintronic materials and devices

AU - Vopsaroiu, M.

AU - Stanton, T.

AU - Thomas, O.

AU - Cain, M.

AU - Thompson, S. M.

PY - 2009/4

Y1 - 2009/4

N2 - Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.

AB - Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.

KW - magneto-refractive effect

KW - non-contact GMR

KW - IR reflectivity

KW - GIANT MAGNETORESISTANCE

KW - GRANULAR FILMS

KW - CONTACTLESS MEASUREMENT

KW - SPIN VALVES

KW - SPECTROSCOPY

KW - SPECTRA

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JO - Measurement Science and Technology

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IS - 4

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Infrared metrology for spintronic materials and devices

Abstract

Keywords

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