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Infrared metrology for spintronic materials and devices

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JournalMeasurement Science and Technology
DatePublished - Apr 2009
Issue number4
Volume20
Number of pages5
Pages (from-to)-
Original languageEnglish

Abstract

Magneto-resistance is the most important characteristic of spintronic materials. This is usually measured using electrical contact probe testing. In this paper, we discuss a simple optical infrared (IR) experiment that allows the non-contact measurement of the magneto-resistance of spintronic materials and devices. The results are compared with characteristic electrical giant magneto-resistance (GMR) curves and show good agreement. The instrument is simpler and more compact than previous demonstrators, offering the possibility of routine measurement. The ability to measure a GMR profile using a non-contact, non-destructive IR technique has important implications, enabling in situ sample testing, non-contact profiling of the GMR at a wafer level and spatial resolution GMR measurements.

    Research areas

  • magneto-refractive effect, non-contact GMR, IR reflectivity, GIANT MAGNETORESISTANCE, GRANULAR FILMS, CONTACTLESS MEASUREMENT, SPIN VALVES, SPECTROSCOPY, SPECTRA

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