Insights from Rights and Wrongs: A Large Language Model for Solving Assertion Failures in RTL Design

Jie Zhou; Youshu Ji; Ning Wang; Yuchen Hu; Yinyao Jiao; Bingkun Yao; Xinwei Fang; Shuai Zhao; Nan Guan; Zhe Jiang

Insights from Rights and Wrongs: A Large Language Model for Solving Assertion Failures in RTL Design

Jie Zhou, Youshu Ji, Ning Wang, Yuchen Hu, Yinyao Jiao, Bingkun Yao, Xinwei Fang^*, Shuai Zhao, Nan Guan, Zhe Jiang^*

^*Corresponding author for this work

Computer Science

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	62nd DAC, Chips to Systems Conference, proceedings
Number of pages	7
Publication status	Accepted/In press - 2025
Event	62nd Design Automation Conference - Moscone West, San Francisco, United States Duration: 22 Jun 2025 → 25 Jun 2025

Conference

Conference	62nd Design Automation Conference
Country/Territory	United States
City	San Francisco
Period	22/06/25 → 25/06/25

Bibliographical note

This is an author-produced version of the published paper. Uploaded in accordance with the University’s Research Publications and Open Access policy.

Cite this

@inproceedings{d4440a0e22c54201a524cd10e8e7b53a,

title = "Insights from Rights and Wrongs: A Large Language Model for Solving Assertion Failures in RTL Design",

author = "Jie Zhou and Youshu Ji and Ning Wang and Yuchen Hu and Yinyao Jiao and Bingkun Yao and Xinwei Fang and Shuai Zhao and Nan Guan and Zhe Jiang",

note = "This is an author-produced version of the published paper. Uploaded in accordance with the University{\textquoteright}s Research Publications and Open Access policy. ; 62nd Design Automation Conference ; Conference date: 22-06-2025 Through 25-06-2025",

year = "2025",

language = "English",

booktitle = "62nd DAC, Chips to Systems Conference, proceedings",

}

TY - GEN

T1 - Insights from Rights and Wrongs

T2 - 62nd Design Automation Conference

AU - Zhou, Jie

AU - Ji, Youshu

AU - Wang, Ning

AU - Hu, Yuchen

AU - Jiao, Yinyao

AU - Yao, Bingkun

AU - Fang, Xinwei

AU - Zhao, Shuai

AU - Guan, Nan

AU - Jiang, Zhe

N1 - This is an author-produced version of the published paper. Uploaded in accordance with the University’s Research Publications and Open Access policy.

PY - 2025

Y1 - 2025

UR - https://arxiv.org/abs/2503.04057

M3 - Conference contribution

BT - 62nd DAC, Chips to Systems Conference, proceedings

Y2 - 22 June 2025 through 25 June 2025

ER -

Insights from Rights and Wrongs: A Large Language Model for Solving Assertion Failures in RTL Design

Conference

Bibliographical note

Other files and links

Embargoed Document

Cite this