Abstract
A two-dimensional dysprosium germanide of stoichiometry DyGe2 on the Ge(111) surface, with a nominal Dy coverage of one monolayer, has been investigated using medium-energy ion scattering. A quantitative structural analysis has revealed that the Dy atoms reside beneath a well-ordered Ge(111) bilayer, rotated by 180 degrees with respect to the bulk. Upon adsorption of hydrogen, the buckling of the top layer was seen to reverse with a corresponding expansion of the Dy-Ge bond length. Possible generalizations for other rare earth/semiconductor systems are discussed.
Original language | English |
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Pages (from-to) | 5016-5020 |
Number of pages | 5 |
Journal | Physical Review B |
Volume | 62 |
Issue number | 8 |
Publication status | Published - 15 Aug 2000 |
Keywords
- 2-DIMENSIONAL ER SILICIDE
- SI(111)
- OVERLAYERS
- SURFACES
- PHASES
- ERSI2